发明名称 OVERLAY MASK AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: An overlay mask and a method for manufacturing the same are provided to stabilize a lithography process by etching the quartz board of a mask. CONSTITUTION: A chromic pattern(420) is formed on a quartz board(410) in corresponding to an overlay vernier pattern. A photo-resist pattern(435) for exposing the quartz board through the chromic pattern is formed. The exposed quartz board is partially etched. The overlay vernier pattern is formed into a box or bar type. The etching depth of the quartz board is regulated by the focus differences between overlay regions.
申请公布号 KR20100074771(A) 申请公布日期 2010.07.02
申请号 KR20080133286 申请日期 2008.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, DAE HEE;KWON, KI SUNG
分类号 H01L23/544 主分类号 H01L23/544
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