发明名称 |
OVERLAY MASK AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: An overlay mask and a method for manufacturing the same are provided to stabilize a lithography process by etching the quartz board of a mask. CONSTITUTION: A chromic pattern(420) is formed on a quartz board(410) in corresponding to an overlay vernier pattern. A photo-resist pattern(435) for exposing the quartz board through the chromic pattern is formed. The exposed quartz board is partially etched. The overlay vernier pattern is formed into a box or bar type. The etching depth of the quartz board is regulated by the focus differences between overlay regions.
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申请公布号 |
KR20100074771(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133286 |
申请日期 |
2008.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, DAE HEE;KWON, KI SUNG |
分类号 |
H01L23/544 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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