发明名称 EXPOSURE DEVICE AND METHOD OF MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To measure film thickness of an immersion liquid on a substrate when the immersion liquid causing a liquid residue on the substrate is used. <P>SOLUTION: The exposure device for exposing a substrate (5) to light through an immersion liquid includes: a substrate stage (13) capable of moving the substrate (5); an immersion liquid supply means (6) to supply the immersion liquid to a space; an immersion liquid recovery means (7) to recover the immersion liquid from the space; and film thickness measurement means (22, 23) to measure the film thickness of the immersion liquid formed on the substrate (5) after exposure. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010147448(A) 申请公布日期 2010.07.01
申请号 JP20080326599 申请日期 2008.12.22
申请人 CANON INC 发明人 IWASAKI YUICHI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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