发明名称 |
RADIATION DETECTOR AND METHOD OF CORRECTING DEFECT OF THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a radiation detector 11 capable of acquiring a radiation image fitting in a specification in relation to a defect even when the defect occurs in a photoelectric conversion substrate 12. <P>SOLUTION: A connection part between a thin-film transistor 22 of a defective pixel Pa outputting a defect signal larger than a specification of a photoelectric conversion substrate 12 and a signal wire 26 is cut. Even when a defect occurs in the photoelectric conversion substrate 12, a radiation image fitting in a specification in relation to the defect can be acquired by cutting a part causing the generation of a defect signal. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010147407(A) |
申请公布日期 |
2010.07.01 |
申请号 |
JP20080325756 |
申请日期 |
2008.12.22 |
申请人 |
TOSHIBA CORP;TOSHIBA ELECTRON TUBES & DEVICES CO LTD |
发明人 |
WAKAMATSU SHUNSUKE |
分类号 |
H01L27/14;G01T1/20;H01L27/146;H01L31/09;H04N5/32 |
主分类号 |
H01L27/14 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|