发明名称 METHOD OF MEASURING TOPOLOGY OF FUNCTIONAL LIQUID DROPLET IN PIXEL, TOPOLOGY MEASURING APPARATUS OF FUNCTIONAL LIQUID IN PIXEL, LIQUID EJECTION APPARATUS, METHOD OF MANUFACTURING ELECTRO-OPTICAL APPARATUS, ELECTRO-OPTICAL APPARATUS, AND ELECTRONIC APPARATUS
摘要 A method of measuring topology of functional liquid in a pixel, in which thickness or volume of the functional liquid in the pixel is measured by a surface topology measuring apparatus comprising: measuring surface topologies in which surface topology of the functional liquid in the pixel and surface topology of the bank are measured by the surface topology measuring apparatus, and measurement parameters regarding the surface topologies are generated; adding a bank height in which a height parameter of a height of the bank is added to the measurement parameter of a surface of the functional liquid in the pixel of the measurement parameter generated; and calculating topology in which the thickness or the volume of the functional liquid in the pixel is calculated based on the added measurement parameter of the surface of the functional liquid in the pixel and the measurement parameter of the surface of the bank.
申请公布号 US2010165354(A1) 申请公布日期 2010.07.01
申请号 US20100720210 申请日期 2010.03.09
申请人 SEIKO EPSON CORPORATION 发明人 SAKAI HIROFUMI;ANAN MAKOTO
分类号 G01B11/02 主分类号 G01B11/02
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