发明名称 TEST MODE ENABLE CONTROL CIRCUIT
摘要 PURPOSE: A test mode enable control circuit is provided to prevent a mode register set from being entered a test mode unintentionally by controlling the entrance of a test mode according to a fuse cutting. CONSTITUTION: A fuse set(20) comprises a first fuse and a second fuse. The fuse set generates a first set signal and a second set signal. A control signal generating unit(22) generates a control signal. The control signal is enabled according to the combination of the first and second set signal. A delivery control unit(24) transfers a first test mode enable signal. The delivery control unit outputs a second test mode enable signal for entering a test-mode. The delivery control unit disables the second test mode enable signal.
申请公布号 KR20100073376(A) 申请公布日期 2010.07.01
申请号 KR20080132034 申请日期 2008.12.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, DUCK HWA
分类号 G11C29/04;G11C7/10 主分类号 G11C29/04
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