发明名称 Structure and Method for Testing MEMS Devices
摘要 A method for determining the presence of a sacrificial layer under a structure. The method includes providing at least one structure arranged above a substrate having a major surface lying in a plane, the at least one structure being clamped at at least one side. The method further includes exerting a force, such as a mechanical force, on the at least one structure. The force may have a predetermined amplitude and a component perpendicular to the substrate. Still further, the method includes determining the deflection of the at least one structure perpendicular to the plane of the substrate, and correlating the deflection of the at least one structure to the presence of a sacrificial layer between the substrate and the structure.
申请公布号 US2010163870(A1) 申请公布日期 2010.07.01
申请号 US20090641022 申请日期 2009.12.17
申请人 IMEC 发明人 BAREL GREGORY VAN
分类号 H01L23/58;H01L21/66 主分类号 H01L23/58
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