发明名称 |
TRENCH SCHOTTKY BARRIER DIODE |
摘要 |
PROBLEM TO BE SOLVED: To provide a trench Schottky barrier diode that improves the relation of trade-off between a leakage current IR in reverse direction and a forward drop voltage VF even when the carrier balance is excessive in n because of the variation of production. SOLUTION: The trench Schottky barrier diode 100 includes: a semiconductor substrate 110 provided with an n<SP>+</SP>-type cathode area 112 and an n<SP>-</SP>-type drift area 114; a trench area 116 that is provided with a plurality of second main-surface-side trench areas 122 having such a structure where a conductive material 126 is varied with an insulation layer 124 in between and a plurality of p-type first main-surface-side trench areas 120; a mesa area 118 that is located at a part pinched with adjacent trench areas 116 in the drift area 114; and a barrier metal layer 128 that is formed on the second main surface of the semiconductor substrate 110 and forms Schottky junction with the mesa area 118. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010147399(A) |
申请公布日期 |
2010.07.01 |
申请号 |
JP20080325665 |
申请日期 |
2008.12.22 |
申请人 |
SHINDENGEN ELECTRIC MFG CO LTD |
发明人 |
SUZUKI NORIAKI;KITADA MIZUE;KURI SHINJI;ONO JUNICHI;MARUOKA MICHIAKI;ISHIZUKA NOBUTAKA |
分类号 |
H01L29/47;H01L29/872 |
主分类号 |
H01L29/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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