| 摘要 |
PURPOSE: A semiconductor integrated circuit is provided to optionally test a specific circuit regardless of the electrical state of a fuse in a package step by easily changing the operation mode of the specific circuit. CONSTITUTION: A first and second mode setup unit(110,120) respond to a test mode signal, an address signal, and a reset signal. The first and second mode setup unit respectively applies a first and a second controlling signal. A selection signal generation unit(130) provides a selection signal according to an electric connection condition of a fuse. A mode selection unit(140) selects a first and a second controlling signal and supplies an enable signal. The mode selection unit controls the active mode of a target circuit unit.
|
