| 摘要 |
It is described a method and a CT system for measuring dual-energy X- ray attenuation data of an object. The CT system comprises a rotatable holder, an X-ray source comprising two different X-ray focus points, and an X-ray detection device comprising a plurality of detector elements exhibiting different spectral sensitivities. The method comprises the steps of (a) adjusting the X-ray source such that it emits X-rays originating a first focus point, (b) acquiring first attenuation data separately with first detector elements and with second detector elements, (c) moving the X-ray focus discretely to a second focus point, and (d) acquiring second attenuation data separately with both types of detector elements. Thereby the two focus points are spatially separated from each such that a first beam path originating from the first focus point penetrates a certain voxel within the object and impinges on a first detector element and a second beam path originating from the second X-ray focus point penetrates the same voxel and impinges on a second detector element.
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