发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating capacitor of a semiconductor device is provided to prevent a leakage current by forming a support layer pattern supporting an upper end of the storage node and reducing a crack. CONSTITUTION: An inter-layer insulating film(210) including a storage node contact(220) is formed on a semiconductor substrate(200). A mold dielectric film and a metal oxide support layer are formed on the inter-layer insulating film. The metal oxide support layer and the mold dielectric film are patterned to form a storage node. A support layer pattern supporting the upper end of the storage electrode by removing a part of metal oxide support layer. The mold dielectric film is removed to form the storage electrode of a cylindrical structure. The dielectric film(280) and the plate electrode(290) are formed on the storage electrode.
申请公布号 KR20100073097(A) 申请公布日期 2010.07.01
申请号 KR20080131684 申请日期 2008.12.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, DONG SU;CHANG, JUN SOO;LEE, EUN A
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
代理机构 代理人
主权项
地址