发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating capacitor of a semiconductor device is provided to prevent a leakage current by forming a support layer pattern supporting an upper end of the storage node and reducing a crack. CONSTITUTION: An inter-layer insulating film(210) including a storage node contact(220) is formed on a semiconductor substrate(200). A mold dielectric film and a metal oxide support layer are formed on the inter-layer insulating film. The metal oxide support layer and the mold dielectric film are patterned to form a storage node. A support layer pattern supporting the upper end of the storage electrode by removing a part of metal oxide support layer. The mold dielectric film is removed to form the storage electrode of a cylindrical structure. The dielectric film(280) and the plate electrode(290) are formed on the storage electrode.
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申请公布号 |
KR20100073097(A) |
申请公布日期 |
2010.07.01 |
申请号 |
KR20080131684 |
申请日期 |
2008.12.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, DONG SU;CHANG, JUN SOO;LEE, EUN A |
分类号 |
H01L27/108;H01L21/8242 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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