发明名称 |
Methods and Apparatus to Test Electronic Devices |
摘要 |
Methods and apparatus to test electronic devices are disclosed. An example method includes setting a first controlled switch to prevent a current detect signal from tripping an overcurrent protection event controlling an operation of the device; setting a second controlled switch to route a first sensed voltage associated with the device to a voltage adjuster; sending a calibration current corresponding to a target threshold current through the device; detecting the first sensed voltage while the calibration current flows through the device; and setting a reference signal substantially equal to the first sensed voltage, wherein the reference signal is to be used to generate the current detect signal.
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申请公布号 |
US2010164528(A1) |
申请公布日期 |
2010.07.01 |
申请号 |
US20080345419 |
申请日期 |
2008.12.29 |
申请人 |
RAHMAN ABIDUR;VOGEL CHRIS |
发明人 |
RAHMAN ABIDUR;VOGEL CHRIS |
分类号 |
G01R31/26;H02H3/08 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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