发明名称 METHOD OF FABRICATING HIGH INTEGRATED SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS FABRICATED THEREBY
摘要 <p>PURPOSE: A method for fabricating high integrated semiconductor apparatus and a semiconductor apparatus fabricated thereby are provided to prevent the damage of a channel region by replacing a gate formation process with an ion implantation process and a wet etching process. CONSTITUTION: A pillar pattern is formed on a semiconductor substrate(202). A conductive layer(210) surrounds the pattern. An oxide layer(204) is formed by partially changing the property of the conductive layer through an ion implantation process. A hard mask nitride layer(206) is formed on the oxide layer. A gate oxide layer is formed between the pattern and the conductive layer.</p>
申请公布号 KR20100073715(A) 申请公布日期 2010.07.01
申请号 KR20080132463 申请日期 2008.12.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SUK MIN;KIM, SEONG HWAN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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