发明名称 |
METHOD OF FABRICATING HIGH INTEGRATED SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS FABRICATED THEREBY |
摘要 |
<p>PURPOSE: A method for fabricating high integrated semiconductor apparatus and a semiconductor apparatus fabricated thereby are provided to prevent the damage of a channel region by replacing a gate formation process with an ion implantation process and a wet etching process. CONSTITUTION: A pillar pattern is formed on a semiconductor substrate(202). A conductive layer(210) surrounds the pattern. An oxide layer(204) is formed by partially changing the property of the conductive layer through an ion implantation process. A hard mask nitride layer(206) is formed on the oxide layer. A gate oxide layer is formed between the pattern and the conductive layer.</p> |
申请公布号 |
KR20100073715(A) |
申请公布日期 |
2010.07.01 |
申请号 |
KR20080132463 |
申请日期 |
2008.12.23 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SUK MIN;KIM, SEONG HWAN |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|