发明名称 |
PLASMA TREATMENT APPARATUS, PLASMA TREATMENT METHOD, AND SEMICONDUCTOR ELEMENT |
摘要 |
<p>In a chamber (1) of a plasma processing apparatus (50), a cathode electrode (2) and an anode electrode (3) are disposed at a distance from each other. The cathode electrode (2) is supplied with electric power from an electric power supply portion (4). The anode electrode (3) is electrically grounded and a substrate (7) is placed thereon. The anode electrode (3) contains a heater (21). In an upper wall portion of the chamber (1), an exhaust port (19a) is provided and connected to a vacuum pump (20b) through an exhaust pipe (20a). In a lower wall portion of a wall surface of the chamber (1), a gas introduction port (10) is provided. A gas supply portion (8) is provided outside the chamber (1).</p> |
申请公布号 |
EP2202785(A1) |
申请公布日期 |
2010.06.30 |
申请号 |
EP20080829812 |
申请日期 |
2008.09.02 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
KISHIMOTO, KATSUSHI;FUKUOKA, YUSUKE |
分类号 |
H01L21/205;H01L21/3065 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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