发明名称 Semiconductor device and fabrication method thereof
摘要 In order to diversify a current control method of a semiconductor device, improve performance (including a current drive performance) of the semiconductor device, and reduce a size of the semiconductor device, a second gate may be formed inside a substrate that forms a channel upon applying a bias voltage thereto. In one aspect, the semiconductor device includes: a well region of a first conductivity; source and drain regions of a second conductivity in the well region; a first gate on an oxide layer above the well region, controlling a first channel region of a second conductivity between the source region and the drain region; and a second gate under the first channel region.
申请公布号 US7745299(B2) 申请公布日期 2010.06.29
申请号 US20080252321 申请日期 2008.10.15
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 YUN HYUNG SUN
分类号 H01L21/336 主分类号 H01L21/336
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