发明名称 Multi-layer structure with a transparent gate
摘要 A multi-layer structure with a transparent gate includes a MHEMT device structure comprising a GaAs substrate, a Schottky layer and a cap layer formed on the Schottky layer; a transparent gate formed on the Schottky layer being an indium tin oxide, ITO; and a drain and a source formed on the cap layer. Moreover, the MHEMT device structure includes a graded buffer, a buffer layer, a first spacer layer, a channel layer, and a second spacer layer formed between the GaAs substrate and the Schottky layer in a stacked fashion. The multi-layer structure is a transparent gate HEMT employing indium tin oxide which can make HEMT more sensitive to the light wave.
申请公布号 US7745853(B2) 申请公布日期 2010.06.29
申请号 US20080141133 申请日期 2008.06.18
申请人 CHANG GUNG UNIVERSITY 发明人 CHIU HSIEN-CHIN;CHANG LIANN-BE;LIN CHE-KAI
分类号 H01L29/778 主分类号 H01L29/778
代理机构 代理人
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