发明名称 MEASUREMENT SYSTEM FOR AMOUNT OF RADIATION AND MEASURING METHOD USING THE SAME
摘要 PURPOSE: A system for measuring exposure and a method for measuring exposure using the same are provided to enhance the accuracy on a measurement by correcting energy dependency in a low energy area. CONSTITUTION: A method for measuring exposure is as follows. Phantom(50) connected to a high-sensitivity MOSFET dosimeter(100) is arranged at a radiation emitting field. The radiation exposing condition illuminated to the phantom is input. A calibration factor and a dose correction factor are applied to the high-sensitivity MOSFET dosimeter for the exact dose measuring of the exposed value of the phantom. The inner dose of the phantom is read in a real time. The long-term dose and the effective dose of the phantom are measured. The long-term dose and the effective dose are analyzed to determine the suitability of the exposure.
申请公布号 KR20100071593(A) 申请公布日期 2010.06.29
申请号 KR20080130368 申请日期 2008.12.19
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 KIM, CHAN HYEONG;CHO, SUNG KOO;JEONG, JONG HWI;KIM, JONG KYUNG
分类号 G01T1/02;G21C17/00 主分类号 G01T1/02
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