发明名称 EXPOSURE MASK AND METHOD FOR FORMING SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p>PURPOSE: An exposure mask and a method for forming a semiconductor device using the same are provided to accurately form a contact hole pattern without the distortion of the pattern by increasing the resolution in an exposure process. CONSTITUTION: A main contact hole pattern(100a,100b) is arranged in an x-axis direction in zigzags. An auxiliary contact hole pattern(150a-150d) is positioned on an extended line from a y axis direction of the main contact hole pattern. A region except for the main contact hole pattern and the auxiliary contact hole pattern is a light shielding pattern. The main contact hole defines a drain contact of the flash device. The expansion pattern is positioned on the side of the main contact hole pattern.</p>
申请公布号 KR20100071404(A) 申请公布日期 2010.06.29
申请号 KR20080130107 申请日期 2008.12.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHANG, DONG SOOK
分类号 G03F1/50;G03F1/38;G03F7/20;H01L21/027 主分类号 G03F1/50
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