发明名称 Thin film transistor and thin film transistor substrate including a polycrystalline semiconductor thin film having a large heat capacity part and a small heat capacity part
摘要 A TFT and the like capable of realizing performances such as a low threshold voltage value, high carrier mobility and a low leak current easily. A TFT consists of a polycrystalline Si film having a small heat capacity part and a large heat capacity part, and the small heat capacity part is used at least as a channel part. The polycrystalline Si film is formed of a crystal grain film through laser annealing of an energy density with which the small heat capacity part melts completely but the large heat capacity part does not melt completely. Since the channel part is formed of large crystal grains grown from the boundaries between the small heat capacity part and the large heat capacity parts, it is possible to realize performances such as a low threshold voltage value, high carrier mobility and a low leak current by using a typical laser annealing device.
申请公布号 US7745822(B2) 申请公布日期 2010.06.29
申请号 US20050558073 申请日期 2005.11.25
申请人 NEC CORPORATION 发明人 OKUMURA HIROSHI
分类号 H01L29/04;H01L21/20;H01L21/336;H01L21/77;H01L27/12;H01L29/786 主分类号 H01L29/04
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