发明名称 DEPLETION MODE BANDGAP ENGINEERED MEMORY
摘要 Memory cells comprising: a semiconductor substrate having a source region and a drain region disposed below a surface of the substrate and separated by a channel region; a tunnel dielectric structure disposed above the channel region, the tunnel dielectric structure comprising at least one layer having a hole-tunneling barrier height; a charge storage layer disposed above the tunnel dielectric structure; an insulating layer disposed above the charge storage layer; and a gate electrode disposed above the insulating layer are described along with arrays and methods of operation.
申请公布号 US2010155823(A1) 申请公布日期 2010.06.24
申请号 US20100720112 申请日期 2010.03.09
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUE HANG-TING;WANG SZU-YU
分类号 H01L29/792 主分类号 H01L29/792
代理机构 代理人
主权项
地址