发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device including an insulation layer and a manufacturing method thereof are provided to prevent a metal film like a metal silicide to reduce contact resistance from oxidizing due to steaming using a SiON layer containing more oxygen than nitrogen as a liner layer. CONSTITUTION: A SiON layer(10) contains more oxygen than nitrogen and consecutively covers the inner surfaces of groove regions(109). A SiO2 layer(11) is formed by reforming polysilazane and is filled in the groove regions while interposing the SiON layer between the SiO2 layer and the groove regions.
申请公布号 KR20100069616(A) 申请公布日期 2010.06.24
申请号 KR20090124948 申请日期 2009.12.15
申请人 ELPIDA MEMORY, INC. 发明人 MATSUDA YOH;MIYATA KYOKO
分类号 H01L21/76;H01L21/31 主分类号 H01L21/76
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