发明名称 ETCHING METHOD, ETCHING MASK AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要 An etching method forms a metal-fluoride layer at a temperature of 150° C. or higher at least as a part of an etching mask formed over a semiconductor layer; patterns the metal-fluoride layer; and etches the semiconductor layer using the patterned metal-fluoride layer as a mask. According to the etching method, an etching-resistant semiconductor layer such as a Group III-V nitride semiconductor can be easily etched by a relatively simpler process.
申请公布号 US2010155899(A1) 申请公布日期 2010.06.24
申请号 US20070299018 申请日期 2007.04.30
申请人 MITSUBISHI CHEMICAL CORPORATION 发明人 HORIE HIDEYOSHI
分类号 H01L29/20;H01L21/3065 主分类号 H01L29/20
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