发明名称 |
ETCHING METHOD, ETCHING MASK AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME |
摘要 |
An etching method forms a metal-fluoride layer at a temperature of 150° C. or higher at least as a part of an etching mask formed over a semiconductor layer; patterns the metal-fluoride layer; and etches the semiconductor layer using the patterned metal-fluoride layer as a mask. According to the etching method, an etching-resistant semiconductor layer such as a Group III-V nitride semiconductor can be easily etched by a relatively simpler process.
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申请公布号 |
US2010155899(A1) |
申请公布日期 |
2010.06.24 |
申请号 |
US20070299018 |
申请日期 |
2007.04.30 |
申请人 |
MITSUBISHI CHEMICAL CORPORATION |
发明人 |
HORIE HIDEYOSHI |
分类号 |
H01L29/20;H01L21/3065 |
主分类号 |
H01L29/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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