METHOD AND APPARATUS FOR COVERING A MULTILAYER PROCESS SPACE DURING AT-SPEED TESTING

摘要

In one embodiment, the invention is a method and apparatus covering a multilayer process space during at-speed testing. One embodiment of a method for selecting a set of paths with which to test a process space includes determining a number N of paths to be included in the set of paths such that at least number M of paths in N for which testing of the process space will fail, computing a metric that substantially ensures that the set of paths satisfies the requirements of N and M, and outputting the metric for use in selecting the set of paths.