发明名称 SYSTEM AND PROCESSING OF A SUBSTRATE
摘要 A system for processing a substrate comprising a loading station for receiving the substrate; a bottom surface inspection station for inspecting the bottom surface of the substrate; a top surface inspection station for inspecting the top surface of the substrate and; a sorting station for sorting the substrate into a predetermined category based upon the bottom surface inspection and top surface inspection.
申请公布号 WO2010071609(A2) 申请公布日期 2010.06.24
申请号 WO2009SG00484 申请日期 2009.12.17
申请人 ROKKO VENTURES PTE LTD;YANG, HAE, CHOON 发明人 YANG, HAE, CHOON
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
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