发明名称 APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR APPARATUS
摘要 PROBLEM TO BE SOLVED: To enhance the uniformity of the film thickness distribution of a plating film irrespective of the film thickness of the plating film. SOLUTION: An apparatus for manufacturing a semiconductor apparatus includes a substrate holding unit 8, a power supply unit 3, an anode 6, and a plurality of dielectric bodies 13. The substrate holding unit 8 can hold a substrate 20 having a cathode 5. The power supply unit 3 supplies the electric power to a peripheral part of the cathode 5. The anode 6 is provided at the position opposite to the cathode 5. A plurality of dielectric bodies 13 are provided between the cathode 5 and the anode 6. The plurality of dielectric bodies 13 are constituted so that, when the plurality of dielectric bodies 13 are projected on a surface parallel to the surface of the cathode 5, the projected patterns are substantially uniform within a plane, and the projected area is variable. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010138433(A) 申请公布日期 2010.06.24
申请号 JP20080314219 申请日期 2008.12.10
申请人 RENESAS ELECTRONICS CORP 发明人 FURUYA AKIRA
分类号 C25D21/12;C25D7/12;C25D17/00;C25D21/00 主分类号 C25D21/12
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