| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor data processing device performing a highly flexible self test on an internal circuit, while being installed in a system. SOLUTION: The semiconductor data processing device is provided with: test circuits (7, 8) for generating a test pattern in a CPU and internal circuits, testing them and maintaining the test results; a test control circuit (6) for activating the test circuits; a test start register (9); a test status register (10); and a test general register (11). With a start bit set in the test start register, the test control circuit starts a test operation of the CPU with the test circuits, accumulates test results, and resets the CPU and the internal circuits in response to the completion of the test operation. Then, upon confirming the completion of test with the value of the test status register, the CPU reads the test results from the test circuits for determination, and determines whether to continuously perform the test according to setting of the test general register for continuity of the test. COPYRIGHT: (C)2010,JPO&INPIT |
