X-RAY EXAMINATION DEVICE AND METHOD

摘要

The present invention relates to an X-ray examination device by which the problems of high count rate in the construction of a spectral CT scanner based on photon counting can be overcome. The proposed X-ray examination device comprises: an X-ray source (2) for emitting an X-ray beam (4) of X-ray radiation while rotating around an imaging region (5), an X-ray detector (6) having a plurality of detector cells (61) for detecting X- ray radiation emitted by said X-ray source (2) and having passed through said imaging region (5), a control unit (9) for modulating the source current of said X-ray source (2) between at least two different source currents to obtain at least two detection data sets for at least two different X-ray fluxes, wherein the lowest X-ray flux is low enough to avoid overloading of the X-ray detector (6) in the direct X-ray beam, and a reconstruction unit (10) for reconstructing an X-ray image from said at least two detection data sets, wherein the pixel values of the pixels of said X-ray image are reconstructed taking into account whether or not the higher X-ray flux resulted in an overloading of the X-ray detector (6) at the respective detector cells.