发明名称 COLOR IRREGULARITY MEASURING METHOD AND COLOR IRREGULARITY MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a color irregularity measuring method and a color irregularity measuring device for measuring color irregularities accurately. Ž<P>SOLUTION: This color irregularity measuring method is described as follows: a color pattern image is displayed on a projector 2; the color pattern image is imaged by an imaging device 3; a reference chromaticity at the image center of the color pattern image is measured by a reference chromaticity measuring device 4; a measurement chromaticity at the image center of color pattern imaged image data acquired by imaging is measured; a chromaticity conversion correction coefficient is calculated based on the reference chromaticity and the measurement chromaticity, an image for color irregularity measurement is displayed on the projector 2; the displayed image for color irregularity measurement is imaged; a chromaticity at a measuring position in the imaged image data for color irregularity measurement is measured; the measured chromaticity is corrected by the chromaticity conversion correction coefficient; and the color irregularities are measured based on the corrected chromaticity. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010139324(A) 申请公布日期 2010.06.24
申请号 JP20080314776 申请日期 2008.12.10
申请人 SEIKO EPSON CORP 发明人 MURAKAMI TAKUSHI
分类号 G01J3/51;G01M11/00;G01N21/88;G02F1/13 主分类号 G01J3/51
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