| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and device for testing semiconductor element capable of enhancing the repeatability of operation of semiconductor elements. Ž<P>SOLUTION: The method for testing semiconductor includes: a driving step for driving a semiconductor device wherein a plurality of semiconductor elements IGBT1 and IGBT 2 are connected in parallel; and a temperature measurement step for measuring the temperatures of the plurality of semiconductor elements before and after the driving step. The driving step includes a step A for adjusting each gate voltage Vge of the plurality of semiconductor elements so that a constant voltage Vce in an active region is applied between both terminals of each of the plurality of semiconductor elements and a constant current Ic flows between both of the terminals, and a step B for applying a constant gate voltage Vge to the plurality of semiconductor elements and allowing the constant current Ic to flow between both of the terminals of the plurality of semiconductor elements, in saturation regions of the semiconductor elements. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
