发明名称 Second ion mass spectrometry method and imaging method
摘要 The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.
申请公布号 US2010155591(A1) 申请公布日期 2010.06.24
申请号 US20070308326 申请日期 2007.06.13
申请人 MATSUO JIRO 发明人 MATSUO JIRO
分类号 H01J49/26;H01J49/14 主分类号 H01J49/26
代理机构 代理人
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