发明名称 HIGH SPEED DEPOSITION OF MATERIALS HAVING LOW DEFECT DENSITY
摘要 A method and apparatus for the unusually high rate deposition of thin film materials on a stationary or continuous substrate. The method includes the in situ generation of a neutral-enriched deposition medium that is conducive to the formation of thin film materials having a low intrinsic defect concentration at any speed. In one embodiment, the deposition medium is created by forming a plasma from an energy transferring gas; combining the plasma with a precursor gas to form a set of activated species that include ions, ion-radicals, and neutrals; and selectively excluding the species that promote the formation of defects to form the deposition medium. In another embodiment, the deposition medium is created by mixing an energy transferring gas and a precursor gas, forming a plasma from the mixture to form a set of activated species, and selectively excluding the species that promote the formation of defects.
申请公布号 WO2010027841(A3) 申请公布日期 2010.06.24
申请号 WO2009US55004 申请日期 2009.08.26
申请人 OVSHINSKY INNOVATION;OVSHINSKY, STANFORD 发明人 OVSHINSKY, STANFORD
分类号 C23C16/44;C23C16/24;H01L21/205 主分类号 C23C16/44
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