发明名称 METHOD FOR DEPOSITING W THIN FILM
摘要 PURPOSE: A method for depositing a tungsten thin film is provided to regulate the flux of silicon-contained gas and boron-contained gas and the injecting time of the gases using a silicon-boron sacrificial layer for forming a tungsten layer. CONSTITUTION: Silicon-contained gas is deposited on a substrate(S210). The silicon-contained gas is purged with purge gas(S215). A silicon-boron sacrificial layer is formed on the substrate by depositing boron-contained gas on the substrate(S220). The boron-contained gas is purged with the purge gas(S225). A tungsten layer is formed by exposing the silicon-boron sacrificial layer to a precursor containing tungsten(S230). The precursor containing tungsten is purged with the purge gas(S235).
申请公布号 KR20100068845(A) 申请公布日期 2010.06.24
申请号 KR20080127339 申请日期 2008.12.15
申请人 INTEGRATED PROCESS SYSTEMS LTD. 发明人 LEE, SANG JIN;YOU, DONG HO
分类号 H01L21/205 主分类号 H01L21/205
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