发明名称 |
METHOD FOR DEPOSITING W THIN FILM |
摘要 |
PURPOSE: A method for depositing a tungsten thin film is provided to regulate the flux of silicon-contained gas and boron-contained gas and the injecting time of the gases using a silicon-boron sacrificial layer for forming a tungsten layer. CONSTITUTION: Silicon-contained gas is deposited on a substrate(S210). The silicon-contained gas is purged with purge gas(S215). A silicon-boron sacrificial layer is formed on the substrate by depositing boron-contained gas on the substrate(S220). The boron-contained gas is purged with the purge gas(S225). A tungsten layer is formed by exposing the silicon-boron sacrificial layer to a precursor containing tungsten(S230). The precursor containing tungsten is purged with the purge gas(S235).
|
申请公布号 |
KR20100068845(A) |
申请公布日期 |
2010.06.24 |
申请号 |
KR20080127339 |
申请日期 |
2008.12.15 |
申请人 |
INTEGRATED PROCESS SYSTEMS LTD. |
发明人 |
LEE, SANG JIN;YOU, DONG HO |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|