发明名称 CMOS image sensor for improving the amount of light incident a photodiode
摘要 Provided are a CMOS image sensor and a fabricating method thereof. The CMOS image sensor includes a device isolation layer, a plurality of photodiode regions, an interlayer insulating layer, a refracting layer, a planarizing layer, a color filter layer, and a plurality of microlenses. The refracting layer, with a higher refractive index than that of the interlayer insulating layer, is formed through the interlayer insulating layer on portions of the device isolation layer, to divide the interlayer insulating layer and give the divided portions thereof the characteristics of a waveguide.
申请公布号 US7741667(B2) 申请公布日期 2010.06.22
申请号 US20060517890 申请日期 2006.09.08
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 JUNG SUN WOOK
分类号 H01L31/062 主分类号 H01L31/062
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