| 摘要 |
A test apparatus that tests a device under test is provided. The test apparatus includes: a main memory that stores a test data row for testing the device under test; a cache memory that caches the test data row read from the main memory; a pattern generation control section that reads each test data which is not aligned in units of word being a data transfer unit of the main memory and writes the same to cache entries different from each other in the cache memory for each test data; and a pattern generating section that sequentially reads the test data stored of each cache entry in the cache memory and generates a test pattern for testing the device under test.
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