发明名称 Electro-static discharge and latchup resistant semiconductor device
摘要 The present invention relates to a semiconductor device including a substrate layer, a metal-oxide-semiconductor field-effect transistor (MOSFET), a backgate region, an isolation layer and a diode. The MOSFET includes a gate region, a source region and a drain region. The source and drain regions are embedded in the backgate region, which includes a voltage input terminal. The isolation layer is located between the backgate region and the substrate layer and has a doping type opposite that of the backgate region. The diode includes a first terminal connected to the isolation layer and a second terminal coupled to an isolation voltage source.
申请公布号 US7741680(B2) 申请公布日期 2010.06.22
申请号 US20080191028 申请日期 2008.08.13
申请人 ANALOG DEVICES, INC. 发明人 ZHU HAIYANG;FOLEY DAVID
分类号 H01L23/58 主分类号 H01L23/58
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