发明名称 |
Soft error rate calculation method and program, integrated circuit design method and apparatus, and integrated circuit |
摘要 |
A first mathematical expression indicating a dependence of SER on an information storage node diffusion layer area at the same information storage node voltage Vn is derived with a use of a result of measuring a relationship between SER and the information storage node diffusion layer area of a storage circuit or an information holding circuit composed of MISFET using a plurality of information storage node voltages Vn as a parameter. Then, a second mathematical expression is derived from the measurement result by substituting a relationship indicating a dependence of SER on an information storage node voltage at the same information storage node diffusion layer area Sc into the first mathematical expression. SER can be calculated by substituting a desired information storage node diffusion layer area and a desired information storage node voltage of a storage circuit or an information holding circuit into the second mathematical expression.
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申请公布号 |
US7743289(B2) |
申请公布日期 |
2010.06.22 |
申请号 |
US20070896219 |
申请日期 |
2007.08.30 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
FURUTA HIROSHI;MONDEN JUNJI;MIZUGUCHI ICHIRO |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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