发明名称 Integrated circuit having a top side wafer contact and a method of manufacture therefor
摘要 The present invention provides an integrated circuit and a method of manufacture therefore therefor. The integrated circuit (100, 1000), in one embodiment without limitation, includes a dielectric layer (120, 1020) located over a wafer substrate (110, 1010), and a semiconductor substrate (130, 1030) located over the dielectric layer (120, 1020), the semiconductor substrate (130, 1030) having one or more transistor devices (140, 1040) located therein or thereon. The integrated circuit (100, 1000) may further include an interconnect (170, 1810) extending entirely through the semiconductor substrate (130, 1030) and the dielectric layer (120, 1020), thereby electrically contacting the wafer substrate (110, 1010).
申请公布号 US7741205(B2) 申请公布日期 2010.06.22
申请号 US20080016443 申请日期 2008.01.18
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 PHAN TONY THANH;LOFTIN WILLIAM C;LIN JOHN;HOWER PHILIP L
分类号 H01L21/768 主分类号 H01L21/768
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