发明名称 ISOLATION STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A device isolation structure of a semiconductor device and a manufacturing method thereof are provided to simplify manufacturing processes by forming adjacent N and P type impurity areas by doping the impurities on a semiconductor substrate. CONSTITUTION: A first conductive first ion implantation area(20) is formed on a semiconductor substrate(10). A second conductive second ion implantation area(30) is contacted with the first ion implantation area and forms a depletion layer. A first contact electrode(50) is electrically connected to the first ion implantation area. A second contact electrode(60) is electrically connected to the second ion implantation area.
申请公布号 KR20100067965(A) 申请公布日期 2010.06.22
申请号 KR20080126587 申请日期 2008.12.12
申请人 DONGBU HITEK CO., LTD. 发明人 SONG, JUNG GYUN
分类号 H01L21/78 主分类号 H01L21/78
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