DOMAIN CROSSING CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS
摘要
PURPOSE: A domain crossing circuit of a semiconductor memory apparatus is provided to implement a highly reliable operation in a high speed circuit by being synchronized with a clock edge. CONSTITUTION: A sampler(200) responds to a clock signal and delays an internal input signal by a certain interval, and it supplies a sampling internal signal and an edge information signal. An output stage responds to the edge information signal and synchronizes the internal signal with the clock signal to output a final output signal. A trigger signal generation block(220) samples the internal input signal at the falling edge and rising edge of the clock signal to supply a plurality of trigger signals. A combination block(240) selectively synchronizes the internal input signal at the falling edge and rising edge of the clock signal to supply a sampling internal signal. A clock edge information block(260) supplies the edge information of the clock which is an output reference of the sampling internal signal as edge information.
申请公布号
KR20100067864(A)
申请公布日期
2010.06.22
申请号
KR20080126447
申请日期
2008.12.12
申请人
HYNIX SEMICONDUCTOR INC.
发明人
CHOI, HAE RANG;KIM, YONG JU;HAN, SUNG WOO;SONG, HEE WOONG;OH, IC SU;KIM, HYUNG SOO;HWANG, TAE JIN;LEE, JI WANG;JANG, JAE MIN;PARK, CHANG KUN