发明名称 CHEMICAL MECHANICAL POLISHING COMPOSITION AND METHODS RELATING THERETO
摘要 PURPOSE: A chemical and mechanical polishing composition and a method for polishing a chemical machine are provided to selectively eliminate a barrier material about interconnect metal and dielectric substances. CONSTITUTION: A chemical and mechanical method for polishing a substrate comprises the following steps; offering the substrate including a barrier material under the presence of interconnect metal or k dielectric material; offering a chemical and mechanical polishing composition including abrasive 1-40 wt%, oxidizing agent 0-10 wt%, quaternary compound 0.001-5 wt%, and a material of a chemical formula (I) and has pH less than 5; offering a chemical and mechanical polishing pad; raising dynamic contact on the interface between the chemical and mechanical polishing pad and the substrate; distributing the chemical and mechanical polishing composition on the interface between the chemical and mechanical polishing pad and the substrate.
申请公布号 KR20100067610(A) 申请公布日期 2010.06.21
申请号 KR20090117931 申请日期 2009.12.01
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 LIU ZHENDONG
分类号 C09K3/14 主分类号 C09K3/14
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