| 摘要 |
FIELD: physics, computer engineering. ^ SUBSTANCE: invention relates to micro- and nanotechnology and can be used when controlling and diagnosing microprocessor systems. The automated device for testing microprocessor systems contains the following: a testing module (1), units for permanent (2) and on-line storage of data, a unit for processing results and information (5), a control unit (4) which is a switch, a setting device (8), first (6) and second (7) interfaces. The units for permanent (2) and on-line (3) storage of data and the control unit (4) can be made as part of the tested object. ^ EFFECT: broader functional capabilities of the automated device due to possibility of detecting undocumented units and commands in a microprocessor system. ^ 1 dwg |
