发明名称 BONDING APPARATUS AND BONDING METHOD
摘要 <p>A bonding apparatus (10) is provided with a chamber (12) whose inside is kept under inert gas atmosphere; a first plasma torch (20) which is attached to the chamber (12) for performing surface treatment to a pad and an electrode by applying a gas brought into the plasma state to a substrate (41) and a semiconductor chip (42) placed inside the chamber (12); a second plasma torch (30), which is attached to the chamber (12) for performing surface treatment to an initial ball (19) or a wire (18) by applying the gas brought into the plasma state to the initial ball (19) or the wire (18) at the leading end of a capillary (17) positioned in the chamber (12); and a bonding processing section (100) for bonding the surface-treated initial ball (19) and the wire (18) to the surface-treated pad and electrode in the chamber (12). Thus, cleaning of the surfaces of the electrode, the pad and the wire can be effectively performed.</p>
申请公布号 KR20100067135(A) 申请公布日期 2010.06.18
申请号 KR20107012134 申请日期 2008.10.07
申请人 KABUSHIKI KAISHA SHINKAWA;TOHOKU UNIVERSITY 发明人 MAEDA TORU;UTANO TETSUYA;TERAMOTO AKINOBU
分类号 H01L21/60;H01L21/52 主分类号 H01L21/60
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