发明名称 EQUIPMENT FOR CLEANING WAFER OF SCAN TYPE AND CLEAN METHOD AT THE SAME
摘要 PURPOSE: Cleaning equipment and a cleaning method thereof are provided to prevent a defect in a scan tail by eliminating an uneven absorption pressure difference which is caused by the step difference between mount plates that support a wafer. CONSTITUTION: An input module(20) inserts a wafer(10) as a sheet in a first location. An output module(30) discharges the wafer in a second position. A movable module transfers the wafer. A cleaning module(40) comprises an upper cleaning module and a lower cleaning module. The cleaning module is divided into a plurality of cells, each of which operates individually.
申请公布号 KR20100066631(A) 申请公布日期 2010.06.18
申请号 KR20080125014 申请日期 2008.12.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG JINE;KIM, YOUNG EUN;JEON, CHANG SEON
分类号 H01L21/302;H01L21/304 主分类号 H01L21/302
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