SEMICONDUCTOR DEVICE TEST HANDLER AND CONTROLLING METHOD OF THE SAME OF

摘要

PURPOSE: A semiconductor device test handler and a manufacturing method thereof are provided to improve the productivity of a semiconductor by increasing the number of picking members mounted on a loading front head and a rear head formed on an unloading unit. CONSTITUTION: A loading buffer tray transfers a semiconductor device to a test tray. A loading front head(50) loads the semiconductor device on the loading buffer tray. A loading middle head(60) performs the socket-off for the loading buffer tray. A socket-off buffer tray(170) loads the socket-off semiconductor device.