FULLY X-TOLERANT, VERY HIGH SCAN COMPRESSION SCAN TEST SYSTEMS AND TECHNIQUES
摘要
Scan testing and scan compression are key to realizing cost reduction and shipped quality. New defect types in ever more complex designs require increased compression. However, increased density of unknown (X) values reduces effective compression. A scan compression method can achieve very high compression and full coverage for any density of unknown values. The described techniques can be fully integrated in the design-for-test (DFT) and automatic test pattern generation (ATPG) flows. Results from using these techniques on industrial designs demonstrate consistent and predictable advantages over other methods.
申请公布号
WO2010047883(A3)
申请公布日期
2010.06.17
申请号
WO2009US55621
申请日期
2009.09.01
申请人
SYNOPSYS, INC.;WOHL, PETER;WAICUKAUSKI, JOHN A.;NEUVEUX, FREDERIC J.
发明人
WOHL, PETER;WAICUKAUSKI, JOHN A.;NEUVEUX, FREDERIC J.