发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress a local temperature rise in a switching element region of a semiconductor device provided with a vertical switching element group in a semiconductor substrate. SOLUTION: The semiconductor device 100 has the switching element region 50, wherein the vertical switching element group is provided, in its semiconductor substrate. The switching element region 50 includes a first region 51 and a second region 52. In the first region 51, first switching element groups of bipolar structure are provided. In the second region 52, a second switching element group of unipolar structure is provided. The second switching element group is provided between the first switching element groups. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010135646(A) 申请公布日期 2010.06.17
申请号 JP20080311488 申请日期 2008.12.05
申请人 TOYOTA CENTRAL R&D LABS INC 发明人 AOI SACHIKO
分类号 H01L27/04;H01L21/822;H01L21/8222;H01L21/8234;H01L21/8248;H01L21/8249;H01L27/06;H01L27/088;H01L29/417;H01L29/47;H01L29/739;H01L29/78;H01L29/872 主分类号 H01L27/04
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