| 摘要 |
Example methods, apparatus and articles of manufacture to characterize applications are disclosed. A disclosed example method includes collecting resource utilization trace data from the two or more applications simultaneously running on one or more computational devices, determining an intrinsic dimensionality of the collected trace data, the intrinsic dimensionality representing a number of predominate features that substantially characterize the trace data, and characterizing each application's workload based on the determined intrinsic dimensionality.
|
