发明名称 |
SPECIMENS FOR MICROANALYSIS PROCESSES |
摘要 |
The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.
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申请公布号 |
US2010152052(A1) |
申请公布日期 |
2010.06.17 |
申请号 |
US20060997141 |
申请日期 |
2006.07.28 |
申请人 |
GOODMAN STEVEN L;KELLY THOMAS F;TOMICKI TERRI J |
发明人 |
GOODMAN STEVEN L.;KELLY THOMAS F.;TOMICKI TERRI J. |
分类号 |
C40B30/00;C12Q1/02;C12Q1/70;C40B50/14;G01N1/00 |
主分类号 |
C40B30/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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