发明名称 TEST APPARATUS AND DIAGNOSIS METHOD
摘要 Provided is a test apparatus that tests a device under test, comprising: a plurality of modules that each include an output circuit that outputs a prescribed output signal to the device under test and a measurement circuit that measures a prescribed characteristic of the device under test; and a control section that, for each module, causes the measurement circuit to measure output of the output circuit and diagnoses the module based on a measurement result of the measurement circuit. Each measurement circuit measures the output of the corresponding output circuit in parallel, and the control section is provided in common to the plurality of modules and sequentially reads the measurement result of the measurement circuit of each module.
申请公布号 US2010153054(A1) 申请公布日期 2010.06.17
申请号 US20090633660 申请日期 2009.12.08
申请人 ADVANTEST CORPORATION 发明人 HORIGUCHI SATOSHI
分类号 G01R31/02 主分类号 G01R31/02
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