发明名称 APPARATUS AND METHOD FOR MEASURING THE POSITIONS OF MARKS ON A MASK
摘要 An apparatus for measuring the positions of marks on a mask is provided, said apparatus comprising a mask holder for holding the mask, a recording unit for recording the marks of the mask held by the mask holder, an actuating module for moving the mask holder and the recording unit relative to each other, and an evaluating module, which numerically calculates the gravity-induced sagging of the mask in the mask holder and determines the positions of the marks on the mask, based on the calculated sagging, the recordings made by the recording unit and the relative movement between the mask holder and the recording unit, wherein, prior to calculating said sagging, the present position of the mask in the mask holder is determined and is taken into consideration in said numerical calculation, and/or the geometrical dimensions of the mask are taken into consideration in said numerical calculation of sagging.
申请公布号 US2010153059(A1) 申请公布日期 2010.06.17
申请号 US20080594373 申请日期 2008.03.11
申请人 KLOSE GERD;ARNZ MICHAEL;HOF ALBRECHT;KRAUSE HELMUT;STROESSNER ULRICH;MANGER MATTHIAS;SCHELLHORN UWE;BECHSTEIN KARL-HEINZ 发明人 KLOSE GERD;ARNZ MICHAEL;HOF ALBRECHT;KRAUSE HELMUT;STROESSNER ULRICH;MANGER MATTHIAS;SCHELLHORN UWE;BECHSTEIN KARL-HEINZ
分类号 G06F15/00;G01B21/20 主分类号 G06F15/00
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