发明名称 GATE STRUCTURE OF SEMICONDUCTOR DEVICE AND METHODS OF FORMING WORD LINE STRUCTURE AND MEMORY
摘要 A gate structure for a semiconductor device is provided. The gate structure includes a conductive structure. The conductive structure insulatively disposed over a substrate includes a middle portion and two spacer portions. The middle portion has a first surface and two second surfaces. The first surface is between the two second surfaces. The two spacer portions are respectively connected to the two second surfaces of the middle portion. A width of each of the two spacer portions gradually increases from top to bottom.
申请公布号 US2010148239(A1) 申请公布日期 2010.06.17
申请号 US20080333359 申请日期 2008.12.12
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LAI ERH-KUN;LUE HANG-TING
分类号 H01L29/792;H01L21/28;H01L21/768 主分类号 H01L29/792
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