发明名称 |
GATE STRUCTURE OF SEMICONDUCTOR DEVICE AND METHODS OF FORMING WORD LINE STRUCTURE AND MEMORY |
摘要 |
A gate structure for a semiconductor device is provided. The gate structure includes a conductive structure. The conductive structure insulatively disposed over a substrate includes a middle portion and two spacer portions. The middle portion has a first surface and two second surfaces. The first surface is between the two second surfaces. The two spacer portions are respectively connected to the two second surfaces of the middle portion. A width of each of the two spacer portions gradually increases from top to bottom.
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申请公布号 |
US2010148239(A1) |
申请公布日期 |
2010.06.17 |
申请号 |
US20080333359 |
申请日期 |
2008.12.12 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
LAI ERH-KUN;LUE HANG-TING |
分类号 |
H01L29/792;H01L21/28;H01L21/768 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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